Login / Signup
Recovery of faulty TSVs in 3D ICs.
Surajit Kumar Roy
Kaustav Roy
Chandan Giri
Hafizur Rahaman
Published in:
ISQED (2015)
Keyphrases
</>
normal operation
fault diagnosis
model based diagnosis
multiple faults
failure recovery
image processing
recovery algorithm
relational databases
error correction
integrity constraints
database
wide range
optimal solution
objective function
three dimensional
decision making
real world
databases