Location M estimator with optimal edge detector for quality inspection of surface mount device capacitor.
Jayesh D. ChauhanChintan K. ModiKunal J. PithadiyaPublished in: ICWET (2010)
Keyphrases
- edge detector
- edge detection
- detected edges
- gray level
- edge detection algorithms
- figure of merit
- region segmentation
- quality control
- neural network
- scale space
- three dimensional
- gaussian filter
- vector field
- sar images
- image processing
- step edges
- computer vision
- edge detection algorithm
- gradient vector
- d objects
- feature extraction