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Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators.
A. Tsiara
S. A. Srinivasan
S. Balakrishnan
Marianna Pantouvaki
Philippe Absil
Joris Van Campenhout
Kris Croes
Published in:
OFC (2020)
Keyphrases
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reliability analysis
optical properties
physical characteristics
refractive index
printed circuit boards
condition monitoring
fault tree
sigma delta
management system
artificial neural networks
wide field of view