A Unified Defect Pattern Analysis of Wafer Maps Using Density-Based Clustering.
Jaehoon KooSangheum HwangPublished in: IEEE Access (2021)
Keyphrases
- pattern analysis
- density based clustering
- pattern recognition
- high efficiency
- outlier detection
- arbitrary shape
- image analysis
- clustering algorithm
- categorical data
- computational intelligence
- pattern classification
- distributed data mining
- density based clustering algorithm
- clusters of arbitrary shapes
- clustering framework
- preprocessing
- computer vision
- artificial neural networks
- data analysis
- machine learning
- real world
- data sets