MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process.

Ming-Dou Ker Kun-Hsien Lin Che-Hao Chuang

Published in: IEICE Trans. Electron. (2005)

Keyphrases

high density
mixed signal
vlsi circuits
high speed
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information security
low power
multi channel
privacy protection
deep learning
vlsi design
room temperature
analog vlsi
data sets
three dimensional
power consumption