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From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern Enumeration.
Mayler G. A. Martins
Samuel N. Pagliarini
Mehmet Meric Isgenc
Lawrence T. Pileggi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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statistical analysis
database
neural network
artificial intelligence
data analysis
image analysis
virtual environment
augmented reality
genetic algorithm
case study
multiresolution
high speed
pattern matching
virtual reality
statistical tests