Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs.

Sudarshan Bahukudumbi Krishnendu Chakrabarty

Published in: ITC (2006)

Keyphrases

selection algorithm
higher level
computer vision
databases
selection strategy
lower level
data sets
website
case study
data streams
artificial intelligence
test cases
test data
genetic algorithm
real world
integrated circuit
levels of abstraction
massively parallel