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Enhancement of light-emitting diode reliability using silicone microsphere in encapsulant.

Inseok JangWan-Ho KimSie-Wook JeonHyeon KimJae-Pil Kim
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • light emitting
  • light emitting diodes
  • light intensity
  • image enhancement
  • highly reliable
  • information systems
  • image processing
  • contrast enhancement
  • reliability analysis
  • multiscale
  • failure rate