Full-chip leakage current estimation based on statistical sampling techniques.

Shaobo Liu Qinru Qiu Qing Wu

Published in: ACM Great Lakes Symposium on VLSI (2008)

Keyphrases

low cost
statistically sound
high speed
monte carlo
importance sampling
leakage current
sample size
hypothesis testing
image sensor
image processing
response time
hardware and software
random sampling
estimation error
high density
silicon dioxide