A Latchup-Free ESD Power Clamp Circuit with Stacked-Bipolar Devices for High-Voltage Integrated Circuits.
Jae-Young ParkJong-Kyu SongChang-Soo JangSan-Hong KimWon-Young JungTaek-Soo KimPublished in: IEICE Trans. Electron. (2009)
Keyphrases
- integrated circuit
- high voltage
- semiconductor devices
- electron beam
- hardware description language
- printed circuit boards
- phase locked loop
- power consumption
- operating conditions
- single phase
- power reduction
- high speed
- partial discharge
- normal operation
- duty cycle
- high density
- power dissipation
- mobile devices
- chip design
- positive and negative
- data mining
- neural network
- low power
- metal oxide semiconductor
- data sets