Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology.
Shreyas Kumar KrishnappaHamid MahmoodiPublished in: ISQED (2011)
Keyphrases
- reliability analysis
- cmos technology
- nano scale
- low power
- power consumption
- silicon on insulator
- low voltage
- spl times
- parallel processing
- flip flops
- high speed
- low cost
- image sensor
- power dissipation
- embedded dram
- random access memory
- condition monitoring
- digital signal processing
- neural network
- video data
- user interface
- pattern recognition
- case study