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Pre-O2 treatment for LNA gate oxide leakage improvement.
Zheng Ke
Sachin Goyal
Solomon Arputharaj
Wendy Wee Yee Lau
Tan Tam Lyn
Lim Dau Fatt
Pandurangan Madhavan
Chandrasekar Venkataramani
Published in:
IRPS (2022)
Keyphrases
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leakage current
low voltage
electrical properties
silicon dioxide
significant improvement
power line
real time
information systems
genetic algorithm
artificial intelligence
website
database systems
medical care
cancer patients
field effect transistors