Denoising and Stability using Independent Component Analysis in High Dimensions - Visual Inspection Still Required.
Subhajit ChakrabartyHaim LevkowitzPublished in: IV (1) (2019)
Keyphrases
- visual inspection
- high dimensions
- denoising
- high dimensional data
- image analysis
- high dimensional
- image denoising
- high dimensional spaces
- laser scanning
- total variation
- fluorescence microscopy images
- pattern recognition
- dimensionality reduction
- image processing
- low dimensional
- poor quality
- signal processing
- multiresolution
- feature extraction