POOR QUALITY
Experts
- Anil K. Jain
- Venu Govindaraju
- Christoph Busch
- Jie Tian
- Arun Ross
- Jianjiang Feng
- Monica Scannapieco
- David Zhang
- Kai Cao
- Xin Yang
- Jufu Feng
- Sundeep Rangan
- Andreas Uhl
- Alyson K. Fletcher
- Eryun Liu
- Carlo Batini
- Fernando Alonso-Fernandez
- Ismael Caballero
- Josef Bigün
- Antoon Bronselaer
- Richard Y. Wang
- Sharath Pankanti
- Bir Bhanu
- Somnath Dey
- Yang W. Lee
- Tieniu Tan
- Emanuele Maiorana
- Jie Zhou
- Julian Fiérrez
- Jana Dittmann
- Ajay Kumar
- Umut Uludag
- Cinzia Cappiello
- Otmane Azeroual
- Raul Sánchez-Reillo
- Barbara Pernici
- Guy De Tré
- Ram Prakash Sharma
- Qijun Zhao
Venues
- CoRR
- ICIQ
- Pattern Recognit.
- ICB
- IEEE Trans. Inf. Forensics Secur.
- IEEE Access
- Sensors
- Pattern Recognit. Lett.
- ICIP
- ICPR
- CCBR
- ACM J. Data Inf. Qual.
- IQ
- BIOSIG
- ICASSP
- RoboCup
- AMIA
- IJCB
- ICML
- IEEE Trans. Pattern Anal. Mach. Intell.
- AVBPA
- AISTATS
- Commun. ACM
- CVPR Workshops
- ICBA
- Neurocomputing
- IGARSS
- Multim. Tools Appl.
- CIARP
- LARS/SBR/WRE
- MedInfo
- NeurIPS
- J. Multivar. Anal.
- Decis. Support Syst.
- Remote. Sens.
- BTAS
- SMC
- AMCIS
- IET Biom.
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