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Assembling 2D blocks into 3D chips.

Johann KnechtelIgor L. MarkovJens Lienig
Published in: ISPD (2011)
Keyphrases
  • high speed
  • integrated circuit
  • variable size
  • high end
  • high density
  • real time
  • databases
  • data mining
  • image processing
  • expert systems
  • mobile devices
  • multiresolution
  • dct coefficients
  • block size