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Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme.

Huan-Chih TsaiKwang-Ting ChengSudipta Bhawmik
Published in: DAC (1999)
Keyphrases
  • special case
  • test data
  • closely related
  • real time
  • databases
  • real world
  • genetic algorithm
  • decision making
  • similarity measure
  • computational complexity
  • expert systems
  • quality measures
  • test suite
  • detection scheme