Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs.
Ciaran J. BrennanKiran V. ChattyJeff SloanPaul DunnMujahid MuhammadRobert GauthierPublished in: Microelectron. Reliab. (2007)
Keyphrases
- design automation
- circuit design
- computer aided design
- low cost
- silicon on insulator
- event detection
- nm technology
- cmos technology
- metal oxide semiconductor
- high speed
- fiber optic
- physical design
- test generation
- low power
- power consumption
- embedded systems
- stream processing
- analog vlsi
- database
- image segmentation
- databases