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ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM.
Hayoung Lee
Younwoo Yoo
Seung Ho Shin
Sungho Kang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2022)
Keyphrases
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content addressable
high reliability
high precision
low cost
peer to peer
low overhead
high density
real time
digital libraries
learning objects
main memory
error correction
error correcting
elliptic curve cryptography