A test methodology for wafer scale system.

David L. Landis

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1992)

Keyphrases

scale space
three dimensional
test data
semiconductor manufacturing
data mining
artificial intelligence
data structure
design methodology
massively parallel
neural network
information systems
similarity measure
user interface
test cases
statistical significance
manufacturing process