Login / Signup
Accurate and Insightful Closed-Form Prediction of Subthreshold SRAM Hold Failure Rate.
Léopold Van Brandt
Roghayeh Saeidi
David Bol
Denis Flandre
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
Keyphrases
</>
closed form
failure rate
random variables
point correspondences
iterative procedure
low power
bayesian networks
power consumption
marginal likelihood