Layout regularity metric as a fast indicator of high variability circuits.
Esraa SwillamKareem MadkourMohab AnisPublished in: SoCC (2013)
Keyphrases
- keywords
- artificial neural networks
- distance measure
- euclidean distance
- circuit design
- digital circuits
- high level synthesis
- real time
- shift register
- graph layout
- chip design
- page layout
- analog vlsi
- logic synthesis
- quantum computing
- delay insensitive
- layout design
- outdoor scenes
- distance metric
- information systems
- search engine