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Capturing Post-Silicon Variations Using a Representative Critical Path.

Qunzeng LiuSachin S. Sapatnekar
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
  • critical path
  • job shop scheduling problem
  • low cost
  • high speed
  • high density
  • neural network
  • liquid crystal
  • genetic algorithm
  • artificial intelligence
  • transmission electron microscopy