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Surface science issues in plasma etching.
Gottlieb S. Oehrlein
Marcus F. Doemling
Bernd E. E. Kastenmeier
Peter J. Matsuo
Neal R. Rueger
Marc Schaepkens
Theodorus E. F. M. Standaert
Published in:
IBM J. Res. Dev. (1999)
Keyphrases
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plasma etching
data sets
d objects
key issues
data mining
multiscale
free form
surface points
longitudinal study
low cost