TSV stress-aware full-chip mechanical reliability analysis and optimization for 3D IC.

Moongon Jung Joydeep Mitra David Z. Pan Sung Kyu Lim

Published in: DAC (2011)

Keyphrases

reliability analysis
optimization model
optimization algorithm
optimization problems
high speed
optimization process
integrated circuit
intelligent systems
optimization method
machine learning
evolutionary algorithm
logistic regression
evolutionary computation
analog vlsi