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Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions.

Fabrizio MasinMatteo MeneghiniEleonora CanatoAlessandro BarbatoCarlo De SantiArno StockmanAbhishek BanerjeePeter MoensEnrico ZanoniGaudenzio Meneghesso
Published in: IRPS (2020)
Keyphrases
  • sufficient conditions
  • stability analysis
  • asymptotic stability
  • lipschitz continuity
  • machine learning
  • feature selection
  • learning rate