BS-YOLOv5s: Insulator Defect Detection with Attention Mechanism and Multi-Scale Fusion.
Zengbin ZhangGuohua LvGuixin ZhaoYi ZhaiJinyong ChengPublished in: ICIP (2023)
Keyphrases
- defect detection
- attention mechanism
- multiscale
- visual attention
- image fusion
- feature extraction
- saliency map
- scale space
- image processing
- natural images
- multi sensor
- high temperature
- visual attention model
- data fusion
- textured surfaces
- image representation
- image segmentation
- information retrieval
- wavelet transform
- pairwise
- automated visual inspection
- keypoints
- vision system
- computer vision