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Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources.

Salvador ManichL. Garcia-DeirosJoan Figueras
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
  • data sets
  • neural network
  • real world
  • artificial neural networks
  • test data
  • web resources