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On-chip stimuli generation for ADC dynamic test by ΣΔ technique.

Shakeel AhmadJerzy J. Dabrowski
Published in: ECCTD (2009)
Keyphrases
  • high speed
  • dynamic environments
  • image processing
  • website
  • data structure
  • analog vlsi
  • data sets
  • mobile robot
  • statistical tests
  • high density
  • generation process
  • physical design
  • vlsi implementation