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Parameterised FPGA reconfigurations for efficient test set generation.

Alexandra KourfaliElias VansteenkisteDirk Stroobandt
Published in: ReConFig (2014)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • test data
  • evaluation methodology
  • test cases
  • database
  • feature space
  • signal processing