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as Gate Dielectric for High Performance AlGaN/GaN MIS-HEMTs.
Qiang Wang
Maolin Pan
Penghao Zhang
Luyu Wang
Yannan Yang
Xinling Xie
Hai Huang
Xin Hu
Min Xu
Published in:
IEEE Access (2024)
Keyphrases
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silicon dioxide
gate dielectrics
nano scale
management information systems
information systems
scientific computing
data intensive
high reliability
databases
search engine
decision making
case study
general purpose
structuring elements
leakage current