High-level test synthesis for delay fault testability.
Sying-Jyan WangTung-Hua YehPublished in: DATE (2007)
Keyphrases
- high level
- test data generation
- low level
- statistical significance
- higher level
- neural network
- software development
- program synthesis
- software testing
- fault detection
- programming language
- fuzzy logic
- source code
- test cases
- conceptual model
- low level features
- multiscale
- case study
- computer vision
- artificial intelligence
- critical path
- data mining