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Reducing Average and Peak Test Power Through Scan Chain Modification.

Ozgur SinanogluIsmet BayraktarogluAlex Orailoglu
Published in: J. Electron. Test. (2003)
Keyphrases
  • power reduction
  • power consumption
  • data sets
  • decision making
  • hidden markov models
  • databases
  • real world
  • search engine
  • image segmentation
  • data structure
  • test data
  • statistical significance