Investigation of Self-Heating in ZnO Thin-Film Transistors by In-Situ Gate Resistance Measurement and Effect on Device Mobility Extraction.
Nicholas M. FataYue MaSigurd WagnerNaveen VermaJames C. SturmPublished in: DRC (2024)
Keyphrases
- thin film
- high density
- field effect transistors
- short circuit
- metal oxide semiconductor
- low density
- grain size
- solar cell
- cmos technology
- electron microscopy
- data acquisition
- data center
- multi layer
- low power
- room temperature
- steady state
- white light interferometry
- measurement data
- film thickness
- neural network
- energy consumption
- decision making