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A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI).

Haihua YanAdit D. Singh
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2006)
Keyphrases
  • defect detection
  • neural network
  • website
  • critical path
  • information systems
  • image processing
  • feature extraction
  • association rules
  • test data
  • power consumption
  • textured surfaces