Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis.

John Paul Shen F. Joel Ferguson

Published in: ITC (1988)

Keyphrases

fault detection
fault diagnosis
real life
statistical analysis
data sets
circuit design
inductive learning
quantitative analysis
image analysis
low cost
information extraction
mathematical model
machine learning
automatic extraction
real world
mathematical analysis
numerical analysis
real time
delay insensitive