Login / Signup

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 221, plus XX, ISBN 1-4020-7752-1.

Mile K. Stojcev
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • random access
  • test cases
  • fault model
  • fault models
  • multiview video coding
  • memory size
  • database
  • data mining techniques
  • databases
  • data structure
  • expert systems
  • model based diagnosis