Low Power Test Data Compression Based on LFSR Reseeding.
Jinkyu LeeNur A. ToubaPublished in: ICCD (2004)
Keyphrases
- low power
- test data
- power consumption
- low cost
- high speed
- test cases
- test set
- training data
- image compression
- compression algorithm
- single chip
- wireless transmission
- training set
- high power
- logic circuits
- power reduction
- image sensor
- vlsi architecture
- search based testing
- cmos technology
- vlsi circuits
- training and test data
- digital signal processing
- compression ratio
- data sets
- power dissipation
- low power consumption
- real time
- signal processor
- training samples
- mixed signal
- database
- image transmission