Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests.

Yasunori Tateno Ken Nakata Akio Oya Keita Matsuda Yoshihide Komatsu Shinichi Osada Masafumi Hirata Shigeyuki Ishiyama Toshiki Yoda Atsushi Nitta Tomio Sato

Published in: IRPS (2021)

Keyphrases