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Automatic generation of test circuits for the verification of Quantum deterministic algorithms.
Antonio García de la Barrera Amo
Manuel A. Serrano
Ignacio García Rodríguez de Guzmán
Macario Polo
Mario Piattini
Published in:
QP4SE@ESEC/SIGSOFT FSE (2022)
Keyphrases
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quantum computing
logic circuits
asynchronous circuits
high speed
test generation
logic synthesis
automatically generate
database
neural network
machine learning
evolutionary algorithm
test data
quantum inspired
built in self test