Hierarchical Test Integration Methodology for 3-D ICs.

Che-Wei Chou Jin-Fu Li Yun-Chao Yu Chih-Yen Lo Ding-Ming Kwai Yung-Fa Chou

Published in: IEEE Des. Test (2015)

Keyphrases

database
neural network
artificial intelligence
computer vision
search algorithm
query processing
data integration
test cases
information integration