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Synergistic Reliability and Yield Enhancement Techniques for Embedded SRAMs.
Shyue-Kung Lu
Huan-Hua Huang
Jiun-Lang Huang
Pony Ning
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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multiscale
image processing
contrast enhancement
embedded systems
highly reliable
image enhancement
databases
control software
reliability analysis
multimedia
digital images
color images
relational databases
computer vision
neural network
software reliability
real time