A new heuristic test generation algorithm for sequential circuits.

Toshihiro Arima Mitsukuni Tsuboya Goro Amamiya Jiro Okuda

Published in: DAC (1974)

Keyphrases

generation algorithm
test data generation
optimal solution
search algorithm
bayesian networks
heuristic solution
heuristic methods
high speed
test data
search strategies
solution quality
statistical tests
statistical significance
test suite
packing problem
dynamic programming
artificial neural networks
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