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Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.
Akhil S. Kumar
Michael J. Uren
Matthew D. Smith
Martin Kuball
Justin Parke
H. George Henry
Robert S. Howell
Published in:
IRPS (2023)
Keyphrases
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dynamic programming
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neural network
image sequences
image analysis
state space
efficient implementation