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Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits.
Sarvesh Bhardwaj
Sarma B. K. Vrudhula
Praveen Ghanta
Yu Cao
Published in:
DAC (2006)
Keyphrases
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nano scale
optimization process
optimization algorithm
optimization problems
decision making
structural analysis
knowledge base
website
multi objective
high accuracy
statistical analysis
data sets
process model
global optimization
statistical modeling
model validation
colored petri nets
databases