An Economic Analysis and ROI Model for Nanometer Test.

Brion L. Keller Mick Tegethoff Thomas Bartenstein Vivek Chickermane

Published in: ITC (2004)

Keyphrases

high level
computational model
theoretical framework
machine learning
experimental data
formal model
data mining
image sequences
management system
theoretical analysis
mathematical model
statistical model
test data
object model
network model
economic analysis