Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias.

Breeta SenGupta Urban Ingelsson Erik Larsson

Published in: VLSI Design (2012)

Keyphrases

high density
low cost
reinforcement learning
high speed
ai planning
goal oriented
database
neural network
learning algorithm
state space
test data
planning problems
test suite
stochastic domains