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Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias.

Breeta SenGuptaUrban IngelssonErik Larsson
Published in: VLSI Design (2012)
Keyphrases
  • high density
  • low cost
  • reinforcement learning
  • high speed
  • ai planning
  • goal oriented
  • database
  • neural network
  • learning algorithm
  • state space
  • test data
  • planning problems
  • test suite
  • stochastic domains