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A Hamming code based technique to resolve the bit flip impact on compressed VLSI test data in IP core based SoC.

Harikrishna ParmarUsha Sandeep Mehta
Published in: VDAT (2015)
Keyphrases
  • test data
  • test cases
  • test set
  • training data
  • data sets
  • search based testing
  • training set
  • machine learning
  • learning algorithm
  • training samples
  • low power
  • training and test data