FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults.
David E. LongMahesh A. IyerMiron AbramoviciPublished in: ACM Trans. Design Autom. Electr. Syst. (2000)
Keyphrases
- times faster
- theoretical analysis
- learning algorithm
- computationally efficient
- recently developed
- evolutionary algorithm
- control system
- computational efficiency
- fault diagnosis
- orders of magnitude
- benchmark datasets
- black box
- data mining
- optimization problems
- worst case
- computational cost
- image processing
- information systems
- computer vision