Static Testing of ADCs Using Wavelet Transforms.

Takahiro J. Yamaguchi

Published in: Asian Test Symposium (1997)

Keyphrases

wavelet transform
multiresolution
image coding
dynamic analysis
test cases
low frequency
test data
lossless image compression
translation invariant
software testing
test set
database
subband
high frequency
image compression
hidden markov models
multiscale
data mining