Sign in

Leakage Power Analysis and Reduction for Nanoscale Circuits.

Amit AgarwalSaibal MukhopadhyayArijit RaychowdhuryKaushik RoyChris H. Kim
Published in: IEEE Micro (2006)
Keyphrases
  • power analysis
  • differential power analysis
  • countermeasures
  • smart card
  • elliptic curve
  • high speed
  • power reduction
  • atomic force microscopy
  • information security
  • digital circuits
  • analog circuits